A high-resolution combined scanning laser and widefield polarizing microscope for imaging at temperatures from 4 K to 300 K

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A high-resolution combined scanning laser and widefield polarizing microscope for imaging at temperatures from 4 K to 300 K

Author: Lange, M.; Guenon, S.; Lever, F.; Kleiner, R.; Koelle, D.
Tübinger Autor(en):
Lange, Matthias Michael
Guenon, Stefan
Kleiner, Reinhold
Kölle, Dieter
Lever, Felix
Published in: Review of Scientific Instruments (2017), Bd. 88, Article 123705
Verlagsangabe: Amer Inst Physics
Language: English
Full text: http://dx.doi.org/10.1063/1.5009529
ISSN: 1089-7623
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Artikel
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