In situ synchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon

dc.contributor.author	Maiti, Santanu
dc.date.accessioned	2019-03-20T12:23:35Z
dc.date.available	2019-03-20T12:23:35Z
dc.date.issued	2017
dc.identifier.issn	1466-8033
dc.identifier.uri	http://hdl.handle.net/10900/87154
dc.language.iso	en	de_DE
dc.publisher	Royal Soc Chemistry	de_DE
dc.relation.uri	http://dx.doi.org/10.1039/c7ce01441d	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.subject.ddc	540	de_DE
dc.title	In situ synchrotron X-ray diffraction study of coherently embedded silver nanostructure growth in silicon	de_DE
dc.type	Article	de_DE
utue.quellen.id	20190131163842_00068
utue.publikation.seiten	6811-6820	de_DE
utue.personen.roh	Guha, Puspendu
utue.personen.roh	Juluri, Raghavendra Rao
utue.personen.roh	Bhukta, Anjan
utue.personen.roh	Ghosh, Arnab
utue.personen.roh	Maiti, Santanu
utue.personen.roh	Bhattacharyya, Arpan
utue.personen.roh	Srihari, Velaga
utue.personen.roh	Satyam, Parlapalli V.
dcterms.isPartOf.ZSTitelID	Crystengcomm	de_DE
dcterms.isPartOf.ZS-Issue	45	de_DE
dcterms.isPartOf.ZS-Volume	19	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE