Structural, optical, and electronic characterization of perfluorinated sexithiophene films and mixed films with sexithiophene

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Structural, optical, and electronic characterization of perfluorinated sexithiophene films and mixed films with sexithiophene

Author: Reisz, Berthold; Weimer, Simon; Banerjee, Rupak; Zeiser, Clemens; Lorch, Christopher; Duva, Giuliano; Dieterle, Johannes; Yonezawa, Keiichirou; Yang, Jin-Peng; Ueno, Nobuo; Kera, Satoshi; Hinderhofer, Alexander; Gerlach, Alexander; Schreiber, Frank
Tübinger Autor(en):
Reisz, Berthold
Weimer, Simon
Zeiser, Clemens
Lorch, Christopher
Duva, Giuliano
Dieterle, Johannes
Hinderhofer, Alexander
Gerlach, Alexander
Schreiber, Frank
Published in: Journal of Materials Research (2017), Bd. 32, H. 10, S. 1908-1920
Verlagsangabe: Cambridge Univ Press
Language: English
Full text: http://dx.doi.org/10.1557/jmr.2017.99
ISSN: 2044-5326
DDC Classifikation: 530 - Physics
600 - Technology
Dokumentart: Artikel
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