Enhancing sensitivity in quantum metrology by Hamiltonian extensions

dc.contributor.author	Fraïsse, Julien Mathieu Elias
dc.contributor.author	Braun, Daniel
dc.date.accessioned	2017-09-05T10:14:14Z
dc.date.available	2017-09-05T10:14:14Z
dc.date.issued	2017
dc.identifier.issn	2469-9934
dc.identifier.uri	http://hdl.handle.net/10900/77724
dc.language.iso	en	de_DE
dc.publisher	Amer Physical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1103/PhysRevA.95.062342	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.subject.ddc	600	de_DE
dc.title	Enhancing sensitivity in quantum metrology by Hamiltonian extensions	de_DE
dc.type	Article	de_DE
utue.quellen.id	20170815222223_00401
utue.personen.roh	Fraisse, Julien Mathieu Elias
utue.personen.roh	Braun, Daniel
dcterms.isPartOf.ZSTitelID	Physical Review A	de_DE
dcterms.isPartOf.ZS-Issue	Article 062342	de_DE
dcterms.isPartOf.ZS-Volume	95	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE