Systematic measurements of the gain and the energy resolution of single and double mask GEM detectors

Biswas, S.; Schmidt, D. J.; Abuhoza, A.; Frankenfeld, U.; Garabatos, C.; Hehner, J.; Kleipa, V.; Morhardt, T.; Schmidt, C. J.; Schmidt, H. R.; Wiechula, J.

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Systematic measurements of the gain and the energy resolution of single and double mask GEM detectors

Author:

Biswas, S.; Schmidt, D. J.; Abuhoza, A.; Frankenfeld, U.; Garabatos, C.; Hehner, J.; Kleipa, V.; Morhardt, T.; Schmidt, C. J.; Schmidt, H. R.; Wiechula, J.

Tübinger Autor(en):

Schmidt, Hans Rudolf
Wiechula, Jens

Published in:

Nuclear Instruments & Methods in Physics Research Section A - Accelerators Spectrometers Detectors and Associated Equipment (2016), Bd. 824, S. 504-506

Verlagsangabe:

Elsevier Science Bv

Language:

English

Full text:

http://dx.doi.org/10.1016/j.nima.2015.11.086

ISSN:

1872-9576

DDC Classifikation:

530 - Physics
540 - Chemistry and allied sciences
600 - Technology

Dokumentart:

Artikel