Development of a stacked detector system for the X-ray range and its possible applications

dc.contributor.author	Maier, Daniel
dc.contributor.author	Puerckhauer, Sabina
dc.contributor.author	Santangelo, Andrea
dc.contributor.author	Schanz, Thomas
dc.contributor.author	Tenzer, Christoph
dc.date.accessioned	2016-04-13T14:23:13Z
dc.date.available	2016-04-13T14:23:13Z
dc.date.issued	2014
dc.identifier.issn	0277-786X
dc.identifier.uri	http://hdl.handle.net/10900/69300
dc.language.iso	en	de_DE
dc.publisher	Spie - Int Soc Optical Engineering	de_DE
dc.relation.uri	http://dx.doi.org/10.1117/12.2055881	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	520	de_DE
dc.subject.ddc	530	de_DE
dc.subject.ddc	600	de_DE
dc.title	Development of a stacked detector system for the X-ray range and its possible applications	de_DE
dc.type	ConferenceObject	de_DE
utue.quellen.id	20160330140844_03983
utue.personen.roh	Maier, Daniel
utue.personen.roh	Limousin, Olivier
utue.personen.roh	Meuris, Aline
utue.personen.roh	Puerckhauer, Sabina
utue.personen.roh	Santangelo, Andrea
utue.personen.roh	Schanz, Thomas
utue.personen.roh	Tenzer, Christoph
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE