Cross-Layer Dependability Modeling and Abstraction in System on Chip

dc.contributor.author	Kühn, Johannes Maximilian
dc.contributor.author	Rosenstiel, Wolfgang
dc.date.accessioned	2015-05-06T13:55:18Z
dc.date.available	2015-05-06T13:55:18Z
dc.date.issued	2013
dc.identifier.uri	http://hdl.handle.net/10900/63218
dc.language.iso	en	de_DE
dc.relation.uri	http://download.lis.ei.tum.de/publications/pub_7028964.pdf	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	004	de_DE
dc.title	Cross-Layer Dependability Modeling and Abstraction in System on Chip	de_DE
dc.type	Article	de_DE
utue.personen.roh	Herkersdorf, Andreas
utue.personen.roh	Engel, Michael
utue.personen.roh	Henkel, Jörg
utue.personen.roh	Glaß, Michael
utue.personen.roh	Kleeberger, Veit B.
utue.personen.roh	Kochte, Michael A.
utue.personen.roh	Kühn, Johannes Maximilian
utue.personen.roh	Nassif, Sani R.
utue.personen.roh	Rauchfuss, Holm
utue.personen.roh	Rosenstiel, Wolfgang
utue.personen.roh	Schlichtmann, Ulf
utue.personen.roh	Shafique, Mohammad
utue.personen.roh	Tahoori, Mehdi B.
utue.personen.roh	Teich, Jürgen
utue.personen.roh	Wehn, Norbert
utue.personen.roh	Weis, Christian
utue.personen.roh	Wunderlich, Hans-Joachim
dcterms.isPartOf.ZSTitelID	Proceedings of the 9th Workshop on Silicon Errors in Logic - System Effects	de_DE
dcterms.isPartOf.ZS-Volume	9	de_DE