Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy

dc.contributor.author	Raisch, Christoph Werner
dc.contributor.author	Werner, Robert
dc.contributor.author	Kleiner, Reinhold
dc.contributor.author	Kölle, Dieter
dc.date.accessioned	2014-11-05T15:12:40Z
dc.date.available	2014-11-05T15:12:40Z
dc.date.issued	2014
dc.identifier.issn	1098-0121
dc.identifier.uri	http://hdl.handle.net/10900/57663
dc.language.iso	en	de_DE
dc.publisher	Amer Physical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1103/PhysRevB.90.125120	de_DE
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.title	Electron sampling depth and saturation effects in perovskite films investigated by soft x-ray absorption spectroscopy	de_DE
dc.type	Article	de_DE
utue.quellen.id	20141022002833_00081	de_DE
utue.personen.roh	Ruosi, A.
utue.personen.roh	Raisch, C.
utue.personen.roh	Verna, A.
utue.personen.roh	Werner, R.
utue.personen.roh	Davidson, B. A.
utue.personen.roh	Fujii, J.
utue.personen.roh	Kleiner, R.
utue.personen.roh	Koelle, D.
dcterms.isPartOf.ZSTitelID	Physical Review B	de_DE
dcterms.isPartOf.ZS-Issue	Article 125120	de_DE
dcterms.isPartOf.ZS-Volume	90	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE