Assessing Antisite Defect and Impurity Concentrations in Bi2Te3 Based Thin Films by High-Accuracy Chemical Analysis

Author:

Peranio, Nicola; Winkler, Markus; Duerrschnabel, Michael; Koenig, Jan; Eibl, Oliver

Tübinger Autor(en):

Published in:

Advanced Functional Materials (2013), Bd. 23, H. 39, S. 4969-4976

Verlagsangabe:

Wiley - V C H Verlag Gmbh

Language:

English

Full text:

ISSN:

1616-301X

DDC Classifikation:

530 - Physics
540 - Chemistry and allied sciences

Dokumentart:

Article

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