X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films

dc.contributor.author	Kleiner, Reinhold
dc.contributor.author	Kölle, Dieter
dc.contributor.author	Chassé, Thomas
dc.contributor.author	Glaser, Mathias
dc.contributor.author	Werner, Robert
dc.contributor.author	Raisch, Christoph Werner
dc.date.accessioned	2013-07-17T15:14:36Z
dc.date.available	2013-07-17T15:14:36Z
dc.date.issued	2013
dc.identifier.issn	0021-8979
dc.identifier.uri	http://hdl.handle.net/10900/36059
dc.language.iso	en	de_DE
dc.publisher	Amer Inst Physics	de_DE
dc.relation.uri	http://dx.doi.org/10.1063/1.4789988
dc.rights	info:eu-repo/semantics/closedAccess
dc.subject.ddc	530	de_DE
dc.title	X-ray photoelectron diffraction study of dopant effects in La0.7X0.3MnO3 (X = La, Sr, Ca, Ce) thin films	de_DE
dc.type	Article	de_DE
utue.quellen.id	20130315161744_00049	de_DE
utue.personen.roh	Raisch, C.
utue.personen.roh	Langheinrich, C.
utue.personen.roh	Werner, R.
utue.personen.roh	Kleiner, R.
utue.personen.roh	Koelle, D.
utue.personen.roh	Glaser, M.
utue.personen.roh	Chasse, T.
utue.personen.roh	Chasse, A.
dcterms.isPartOf.ZSTitelID	Journal of Applied Physics	de_DE
dcterms.isPartOf.ZS-Issue	Article 063511	de_DE
dcterms.isPartOf.ZS-Volume	113	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE