Temporal Evolution of Defects and Related Electric Properties in He-Irradiated YBa2Cu3O7-δ Thin Films

dc.contributor.author	Müller, Benedikt
dc.contributor.author	Karrer, Max
dc.contributor.author	Kleiner, Reinhold
dc.contributor.author	Goldobin, Edward
dc.contributor.author	Kölle, Dieter
dc.date.accessioned	2024-12-09T12:58:32Z
dc.date.available	2024-12-09T12:58:32Z
dc.date.issued	2024
dc.identifier.issn	1661-6596
dc.identifier.uri	http://hdl.handle.net/10900/159594
dc.language.iso	en	de_DE
dc.publisher	Basel : Mdpi	de_DE
dc.relation.uri	http://dx.doi.org/10.3390/ijms25147877	de_DE
dc.subject.ddc	540	de_DE
dc.subject.ddc	570	de_DE
dc.title	Temporal Evolution of Defects and Related Electric Properties in He-Irradiated YBa2Cu3O7-δ Thin Films	de_DE
dc.type	Article	de_DE
utue.quellen.id	20241001000000_00913
utue.personen.roh	Keppert, Sandra
utue.personen.roh	Aichner, Bernd
utue.personen.roh	Rohringer, Philip
utue.personen.roh	Bodea, Marius-Aurel
utue.personen.roh	Mueller, Benedikt
utue.personen.roh	Karrer, Max
utue.personen.roh	Kleiner, Reinhold
utue.personen.roh	Goldobin, Edward
utue.personen.roh	Koelle, Dieter
utue.personen.roh	Pedarnig, Johannes D.
utue.personen.roh	Lang, Wolfgang
dcterms.isPartOf.ZSTitelID	International Journal of Molecular Sciences	de_DE
dcterms.isPartOf.ZS-Issue	14	de_DE
dcterms.isPartOf.ZS-Volume	25	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE