Random and Adversarial Bit Error Robustness: Energy-Efficient and Secure DNN Accelerators

Author:

Stutz, David; Chandramoorthy, Nandhini; Hein, Matthias; Schiele, Bernt

Tübinger Autor(en):

Published in:

IEEE Transactions on Pattern Analysis and Machine Intelligence (2023), Bd. 45, H. 3, S. 3632-3647

Verlagsangabe:

IEEE Computer Soc

Language:

English

Full text:

ISSN:

0162-8828

DDC Classifikation:

004 - Data processing and computer science
600 - Technology

Dokumentart:

Article

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