Random and Adversarial Bit Error Robustness: Energy-Efficient and Secure DNN Accelerators

Author:

Stutz, David; Chandramoorthy, Nandhini; Hein, Matthias; Schiele, Bernt

Tübinger Autor(en):

Published in:

IEEE Transactions on Pattern Analysis & amp; Machine Intelligence (2023), Bd. 45, H. 3

Verlagsangabe:

IEEE Computer Society

Language:

English

Full text:

ISSN:

1939-3539

DDC Classifikation:

004 - Data processing and computer science

Dokumentart:

Article

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