The Scale4Edge RISC-V Ecosystem

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The Scale4Edge RISC-V Ecosystem

Author: Ecker, Wolfgang; Adelt, Peer; Mueller, Wolfgang; Heckmann, Reinhold; Krstic, Milos; Herdt, Vladimir; Drechsler, Rolf; Angst, Gerhard; Wimmer, Ralf; Stahl, Rafael; Emrich, Karsten; Mueller-Gritschneder, Daniel; Becker, Bernd; Scholl, Philipp; Jentzsch, Eyck; Schlamelcher, Jan; Grüttner, Kim; Bernardo, Paul Palomero; Bringmann, Oliver; Damian, Mihaela; Oppermann, Julian; Koch, Andreas; Bormann, Jörg; Partzsch, Johannes; Mayr, Christian; Kunz, Wolfgang
Tübinger Autor(en):
Bernardo, Paul Palomero
Bringmann, Oliver
Published in: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE) (2022-05-19), Bd. , S. 808-813
Verlagsangabe: Antwerp : IEEE
Language: English
Full text: https://doi.org/10.23919/DATE54114.2022.9774593
ISSN: 1558-1101
1530-1591
ISBN: 978-3-9819263-6-1
978-1-6654-9637-7
DDC Classifikation: 004 - Data processing and computer science
Dokumentart: Article
ConferenceObject
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