Quantifying the data quality of focal series for inline electron holography

Huang, Michael R. S.; Eljarrat, Alberto; Koch, Christoph T.

dc.contributor.author	Huang, Michael R. S.
dc.date.accessioned	2022-05-23T08:59:20Z
dc.date.available	2022-05-23T08:59:20Z
dc.date.issued	2021
dc.identifier.issn	0304-3991
dc.identifier.uri	http://hdl.handle.net/10900/127191
dc.language.iso	en	de_DE
dc.publisher	Amsterdam	de_DE
dc.relation.uri	http://dx.doi.org/10.1016/j.ultramic.2021.113264	de_DE
dc.subject.ddc	570	de_DE
dc.subject.ddc	600	de_DE
dc.title	Quantifying the data quality of focal series for inline electron holography	de_DE
dc.type	Article	de_DE
utue.quellen.id	20220404000000_00211
utue.personen.roh	Huang, Michael R. S.
utue.personen.roh	Eljarrat, Alberto
utue.personen.roh	Koch, Christoph T.
dcterms.isPartOf.ZSTitelID	Ultramicroscopy	de_DE
dcterms.isPartOf.ZS-Issue	Article 113264	de_DE
dcterms.isPartOf.ZS-Volume	231	de_DE
utue.fakultaet	04 Medizinische Fakultät	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE