RAP Model—Enabling Cross-Layer Analysis and Optimization for System-on-Chip Resilience

dc.contributor.author	Rosenstiel, Wolfgang
dc.date.accessioned	2022-02-17T16:36:59Z
dc.date.available	2022-02-17T16:36:59Z
dc.date.issued	2020
dc.identifier.isbn	978-3-030-52016-8
dc.identifier.isbn	978-3-030-52017-5
dc.identifier.uri	http://hdl.handle.net/10900/124677
dc.language.iso	en	de_DE
dc.publisher	Cham: Springer	de_DE
dc.relation.uri	http://dx.doi.org/10.1007/978-3-030-52017-5_1	de_DE
dc.subject.ddc	004	de_DE
dc.title	RAP Model—Enabling Cross-Layer Analysis and Optimization for System-on-Chip Resilience	de_DE
dc.type	BookPart	de_DE
utue.publikation.seiten	1-27	de_DE
utue.personen.roh	Henkersdorf, Andreas
utue.personen.roh	Engel, Michael
utue.personen.roh	Glaß, Michael
utue.personen.roh	Henkel, Jörg
utue.personen.roh	Kleeberger, Veit B
utue.personen.roh	Kühn, Johannes M
utue.personen.roh	Marwedel, Peter
utue.personen.roh	Mueller-Gritschneder, Daniel
utue.personen.roh	Nassif, Sani R
utue.personen.roh	Rehman, Semeen
utue.personen.roh	Rosenstiel, Wolfgang
utue.personen.roh	Schlichtmann, Ulf
utue.personen.roh	Shafique, Muhammad
utue.personen.roh	Teich, Jürgen
utue.personen.roh	Wehn, Norbert
utue.personen.roh	Weis, Christian
utue.publikation.buchdesbeitrags	Henkel, J., Dutt, N. (Eds.): Dependable Embedded Systems	de_DE