Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations

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Atom-by-atom chemical identification from scanning transmission electron microscopy images in presence of noise and residual aberrations

Author: Hofer, Christoph; Skakalova, Viera; Haas, Jonas; Wang, Xiao; Braun, Kai; Pennington, Robert S.; Meyer, Jannik C.
Tübinger Autor(en):
Hofer, Christoph
Haas, Jonas
Braun, Kai
Pennington, Robert S.
Meyer, Jannik C.
Published in: Ultramicroscopy (2021), Bd. 227, Article 113292
Verlagsangabe: Elsevier
Language: English
Full text: http://dx.doi.org/10.1016/j.ultramic.2021.113292
ISSN: 1879-2723
DDC Classifikation: 600 - Technology
570 - Life sciences; biology
Dokumentart: Article
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