Probing Bias-Induced Electron Density Shifts in Metal-Molecule Interfaces via Tip-Enhanced Raman Scattering

dc.contributor.author	Braun, Kai
dc.contributor.author	Hauler, Otto
dc.contributor.author	Zhang, Dai
dc.contributor.author	Chassé, Thomas
dc.contributor.author	Meixner, Alfred J.
dc.date.accessioned	2021-08-27T11:10:05Z
dc.date.available	2021-08-27T11:10:05Z
dc.date.issued	2021
dc.identifier.issn	1520-5126
dc.identifier.uri	http://hdl.handle.net/10900/118305
dc.language.iso	en	de_DE
dc.publisher	Amer Chemical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1021/jacs.0c09392	de_DE
dc.subject.ddc	540	de_DE
dc.title	Probing Bias-Induced Electron Density Shifts in Metal-Molecule Interfaces via Tip-Enhanced Raman Scattering	de_DE
dc.type	Article	de_DE
utue.quellen.id	20210512015105_00886
utue.publikation.seiten	1816-1821	de_DE
utue.personen.roh	Braun, Kai
utue.personen.roh	Hauler, Otto
utue.personen.roh	Zhang, Dai
utue.personen.roh	Wang, Xiao
utue.personen.roh	Chasse, Thomas
utue.personen.roh	Meixner, Alfred J.
dcterms.isPartOf.ZSTitelID	Journal of The American Chemical Society	de_DE
dcterms.isPartOf.ZS-Issue	4	de_DE
dcterms.isPartOf.ZS-Volume	143	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE