Rayleigh analysis and dielectric dispersion in polycrystalline 0.5(Ba0.7Ca0.3)TiO3-0.5Ba(Zr0.2Ti0.8)O-3 ferroelectric thin films by domain-wall pinning element modeling

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dc.contributor.author Becker, Mark
dc.contributor.author Burkhardt, Claus
dc.contributor.author Schröppel, Birgit
dc.contributor.author Kleiner, Reinhold
dc.contributor.author Kölle, Dieter
dc.date.accessioned 2021-05-10T05:33:10Z
dc.date.available 2021-05-10T05:33:10Z
dc.date.issued 2020
dc.identifier.issn 1089-7550
dc.identifier.uri http://hdl.handle.net/10900/115128
dc.language.iso en de_DE
dc.publisher Amer Inst Physics de_DE
dc.relation.uri http://dx.doi.org/10.1063/5.0025109 de_DE
dc.subject.ddc 530 de_DE
dc.title Rayleigh analysis and dielectric dispersion in polycrystalline 0.5(Ba0.7Ca0.3)TiO3-0.5Ba(Zr0.2Ti0.8)O-3 ferroelectric thin films by domain-wall pinning element modeling de_DE
dc.type Artikel de_DE
utue.quellen.id 20210304112512_00978
utue.personen.roh Becker, M.
utue.personen.roh Burkhardt, C. J.
utue.personen.roh Schroeppel, B.
utue.personen.roh Kleiner, R.
utue.personen.roh Koelle, D.
dcterms.isPartOf.ZSTitelID Journal of Applied Physics de_DE
dcterms.isPartOf.ZS-Issue Article 154103 de_DE
dcterms.isPartOf.ZS-Volume 128 (15) de_DE
utue.fakultaet 04 Medizinische Fakultät de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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