Transport and Noise Properties of sub-100-nm Planar Nb Josephson Junctions with Metallic Hf-Ti Barriers for nano-SQUID Applications

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Transport and Noise Properties of sub-100-nm Planar Nb Josephson Junctions with Metallic Hf-Ti Barriers for nano-SQUID Applications

Author: Morosh, V.; Linek, J.; Mueller, B.; Martinez-Perez, M. J.; Wolter, S.; Weimann, T.; Beyer, J.; Schurig, T.; Kieler, O.; Zorin, A. B.; Kleiner, R.; Koelle, D.
Tübinger Autor(en):
Linek, Julian
Müller, Benedikt
Kleiner, Reinhold
Kölle, Dieter
Martinez Pérez, Maria José
Published in: Physical Review Applied (2020), Bd. 14, Article 054072
Verlagsangabe: Amer Physical Soc
Language: English
Full text: http://dx.doi.org/10.1103/PhysRevApplied.14.054072
ISSN: 2331-7019
DDC Classifikation: 530 - Physics
Dokumentart: Article
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