Abstract:
Scanning near-field optical microscopy (SNOM) opens new frontiers in optical
microscopy and spectroscopy measurements beyond the diffraction limit. The
evolution of the nanotechnology field of devices with new functionality, integration
of new materials to form multifunctional devices, and the understanding of
chemical interactions within complex biological systems such as DNA, bacteria,
cells demand new tools to understand the physics and chemistry of the materials
on the molecular level. SNOM arises as a pioneer tool for optical imaging in
the sub-wavelength dimension [1, 2]. In the SNOM measurement, a probe with
a sharp tip is illuminated with light all through its raster scan over the sample
surface in the locale of the sample nearfield. Hence, the measurement in principle
is limited by the volume of interaction of the nearfield with a size on the order
of the probe tip radius and the sample surface [3]. SNOM emerged in 1984 as an
optical counterpart of scanning probe microscopy. The idea had been introduced
by E.H. Synge in 1928 in [4]. After decades it had been recognized as a visionary
way to circumvent the optical microscopy classical diffraction limit [5]. SNOM
complementary information to other scanning probe microscopy methods can be
gained without pre-treatment of the samples and in a non-destructive way. Further,
SNOM measurements can be performed for a broad range of samples and
in native environments.
SNOM has been successfully accompanied with spectroscopy measurements,
such as tip-enhanced
uorescence spectroscopy and/or tip-enhanced Raman spectroscopy
(TERS) [6], since the visible optical wavelengths have energies that fall
in the energy range of the electronic and vibrational transitions in molecules.
Hence, simultaneous measurements were performed to characterize the samples'
morphology and chemical properties. TERS measurements record the Raman
scattering of the samples in nanoscale dimensions. They reveal valuable information
about chemical interactions, since Raman scattering is considered as the
fingerprint of the compounds and elements inside the material down to single
molecules [7-9].
A recent development in the SNOM setups has been reported, in which the
SNOM probe can scan the near field of the samples in the z-direction in addition to the x and y direction [10, 11]. Hence, SNOM field mapping in the 3D space
has been recorded for different samples such as Cu nanoparticles [12] and Boron
nitride nanotubes [13].
The resolution of the SNOM and TERS instruments is defined by the probes.
Consequently, the fabrication of high quality and reproducible probes is at the
core of developing the SNOM and TERS. There are a variety of probes types,
where the plasmonic nanostructures serving as an antenna are the most successful
ones in recording a high resolution and field enhancement.
Outline
Motivated by the theory and experimental results on the field enhancement and
the high resolution of the nanocone probe, we aim to modify the fabrication of
nanocones on non-planar substrates to have a good reproducibility and control
over the cone geometry. In this work, we propose the fabrication of high quality
SNOM/TERS probes, where the fabrication method has a good throughput and
reproducibility. This work is divided into five chapters presenting the theory of
optics and the physics of the fabrication techniques, then the fabrication method
and the experimental results. Chapter 1 is a survey on the electrodynamics of
plasmonics, then the SNOM/TERS principles and the state of art of the probes,
finally the plasmonic nanocone optical properties, fabrication and application.
Chapter 2 presents the theory of the fabrication techniques employed to engineer
the nanocone. Chapter 3 shows the steps of the fabrication method of the
nanocone on cantilever and optical fiber. Chapter 4 presents the optimization
and experimental results of the fabricated probes made of a single gold nanocone
on an AFM-cantilever. Chapter 5 presents the fabrication of gold nanocones on
optical fibers and optimization of the probe's quality.