Modeling uncertainties in X-ray reflection spectroscopy measurements I: Impact of higher order disk images

dc.contributor.author	Nampalliwar, Sourabh
dc.date.accessioned	2020-10-21T07:42:12Z
dc.date.available	2020-10-21T07:42:12Z
dc.date.issued	2020
dc.identifier.issn	2470-0029
dc.identifier.uri	http://hdl.handle.net/10900/108191
dc.language.iso	en	de_DE
dc.publisher	Amer Physical Soc	de_DE
dc.relation.uri	http://dx.doi.org/10.1103/PhysRevD.101.043010	de_DE
dc.subject.ddc	520	de_DE
dc.subject.ddc	530	de_DE
dc.title	Modeling uncertainties in X-ray reflection spectroscopy measurements I: Impact of higher order disk images	de_DE
dc.type	Article	de_DE
utue.quellen.id	20200715072417_01569
utue.personen.roh	Zhou, Menglei
utue.personen.roh	Ayzenberg, Dimitry
utue.personen.roh	Bambi, Cosimo
utue.personen.roh	Nampalliwar, Sourabh
dcterms.isPartOf.ZSTitelID	Physical Review D	de_DE
dcterms.isPartOf.ZS-Issue	Article 043010	de_DE
dcterms.isPartOf.ZS-Volume	101	de_DE
utue.fakultaet	07 Mathematisch-Naturwissenschaftliche Fakultät	de_DE