Fast fitting of reflectivity data of growing thin films using neural networks

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dc.contributor.author Greco, Alessandro
dc.contributor.author Starostin, Vladimir
dc.contributor.author Gerlach, Alexander
dc.contributor.author Schreiber, Frank
dc.contributor.author Hinderhofer, Alexander
dc.date.accessioned 2020-07-09T09:19:55Z
dc.date.available 2020-07-09T09:19:55Z
dc.date.issued 2019
dc.identifier.issn 1600-5767
dc.identifier.uri http://hdl.handle.net/10900/102484
dc.language.iso en de_DE
dc.publisher Int Union Crystallography de_DE
dc.relation.uri http://dx.doi.org/10.1107/S1600576719013311 de_DE
dc.subject.ddc 530 de_DE
dc.subject.ddc 540 de_DE
dc.subject.ddc 570 de_DE
dc.subject.ddc 610 de_DE
dc.title Fast fitting of reflectivity data of growing thin films using neural networks de_DE
dc.type Artikel de_DE
utue.quellen.id 20200409032300_00179
utue.publikation.seiten 1342-1347 de_DE
utue.personen.roh Greco, Alessandro
utue.personen.roh Starostin, Vladimir
utue.personen.roh Karapanagiotis, Christos
utue.personen.roh Hindcrhofer, Alexander
utue.personen.roh Gerlach, Alexander
utue.personen.roh Pithan, Linus
utue.personen.roh Liehr, Sascha
utue.personen.roh Schreiber, Frank
utue.personen.roh Kowarik, Stefan
dcterms.isPartOf.ZSTitelID Journal of Applied Crystallography de_DE
dcterms.isPartOf.ZS-Volume 52 de_DE
utue.fakultaet 07 Mathematisch-Naturwissenschaftliche Fakultät de_DE


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