Characterization of Oxide Layers on Technical Copper Material Using Ultraviolet Visible (UV-Vis) Spectroscopy as a Rapid On-Line Analysis Tool

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Characterization of Oxide Layers on Technical Copper Material Using Ultraviolet Visible (UV-Vis) Spectroscopy as a Rapid On-Line Analysis Tool

Author: Stiedl, Jan; Green, Simon; Chasse, Thomas; Rebner, Karsten
Tübinger Autor(en):
Stiedl, Jan
Chassé, Thomas
Published in: Applied Spectroscopy (2019), Bd. 73, H. 1, S. 59-66
Verlagsangabe: Sage Publications Inc
Language: English
Full text: http://dx.doi.org/10.1177/0003702818797959
ISSN: 1943-3530
DDC Classifikation: 600 - Technology
540 - Chemistry and allied sciences
530 - Physics
Dokumentart: Artikel
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